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Metal, News
EXTRUSION MASTER – First time possible: fully automatic surface inspection of extruded aluminium profiles

The surface inspection system EXTRUSION MASTER, newly developed by ISRA Parsytec, enables automatic in-line inspection of profile surfaces during the extrusion process for the first time.

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Metal, News
Reliably ensuring the satisfaction of automotive customers – innovation enables defect detection on blanks of any shape

100% quality in preforming: Innovative system opens up a new process step in steel and aluminum production

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Plastic Web, News
All-in-one inspection for optical films including monitoring of material proper-ties

Industry proven inspection technology provides new level of high accuracy quality control through innovative illumination concept

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Ready-to-Use, News
Free forms with reflective surfaces – 3D sensor offers solutions for challenging measurement of curved display and cover glass

The 3D sensor range offers versatile application possibilities for various industries from consumer electronics to precision mechanics

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Flat Panel Display Glass, News
Challenging accuracy: ISRA offers 100% inspection for ultra-thin glass – precise, fast, stable

One of China’s most successful providers of high quality float glass turns to ISRA’s FLOATSCAN Thin Superior for quality assurance

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Flat Panel Display Glass, News
Free forms with reflective surfaces

The 3D sensor range offers versatile application possibilities for various industries from consumer electronics to precision mechanics

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Flat Panel Display Glass, News
All-in-one inspection for optical films including monitoring of material properties

Industry proven inspection technology provides new level of high accuracy quality control through innovative illumination concept

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Flat Panel Display Glass, News
Efficient thin glass inspection in a matter of seconds

Three-dimensional optical surface detection provides fast and complete inspection of flatness, waviness and reflection optics

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Semiconductor, News
Ultra-fast, robust and extremely precise: the next gen-eration of white-light interferometry

New white light interferometer for precision and speed directly on the line

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Semiconductor, News
Meet the latest quality requirements for wafers – high precision edge inspection

State-of-the-art technologies for fast and precise quality control throughout the production chain – universally ap-plicable and easy to use

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