Metal, News
EXTRUSION MASTER – First time possible: fully automatic surface inspection of extruded aluminium profiles

The surface inspection system EXTRUSION MASTER, newly developed by ISRA Parsytec, enables automatic in-line inspection of profile surfaces during the extrusion process for the first time.

Metal, News
Reliably ensuring the satisfaction of automotive customers – innovation enables defect detection on blanks of any shape

100% quality in preforming: Innovative system opens up a new process step in steel and aluminum production

Plastic Web, News
All-in-one inspection for optical films including monitoring of material proper-ties

Industry proven inspection technology provides new level of high accuracy quality control through innovative illumination concept

Ready-to-Use, News
Free forms with reflective surfaces – 3D sensor offers solutions for challenging measurement of curved display and cover glass

The 3D sensor range offers versatile application possibilities for various industries from consumer electronics to precision mechanics

Flat Panel Display Glass, News
Challenging accuracy: ISRA offers 100% inspection for ultra-thin glass – precise, fast, stable

One of China’s most successful providers of high quality float glass turns to ISRA’s FLOATSCAN Thin Superior for quality assurance

Flat Panel Display Glass, News
Free forms with reflective surfaces

The 3D sensor range offers versatile application possibilities for various industries from consumer electronics to precision mechanics

Flat Panel Display Glass, News
All-in-one inspection for optical films including monitoring of material properties

Industry proven inspection technology provides new level of high accuracy quality control through innovative illumination concept

Flat Panel Display Glass, News
Efficient thin glass inspection in a matter of seconds

Three-dimensional optical surface detection provides fast and complete inspection of flatness, waviness and reflection optics

Semiconductor, News
Ultra-fast, robust and extremely precise: the next gen-eration of white-light interferometry

New white light interferometer for precision and speed directly on the line

Semiconductor, News
Meet the latest quality requirements for wafers – high precision edge inspection

State-of-the-art technologies for fast and precise quality control throughout the production chain – universally ap-plicable and easy to use