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Advanced coating monitoring at line speeds >1,500mm/sec

 

COL-Q reliably inspects wafers of all sizes directly after coating and therefore allows for immediate process optimization.

Benefit from:

  • Most accurate and fastest coating process control
  • Full support for Connected PV by gaining valuable insights into your PECVD process and learning how to improve it
  • Application for all wafer sizes up to M12

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Discover our inspection and monitoring solutions for the entire PV manufacturing chain

Inline Process Monitoring

Detect defects on the cell surface after every production stage with utmost precision.

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Inline Quality Sorting

Ensure quality standards by classifying finished solar cells according to their optical properties.

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Connected PV 4.0

Cloud-based tools for significantly enhanced productivity and 100% production transparency in photovoltaic manufacturing.

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