Advanced coating monitoring at line speeds >1,500mm/sec
COL-Q reliably inspects wafers of all sizes directly after coating and therefore allows for immediate process optimization.
Benefit from:
- Most accurate and fastest coating process control
- Full support for Connected PV by gaining valuable insights into your PECVD process and learning how to improve it
- Application for all wafer sizes up to M12
Discover our inspection and monitoring solutions for the entire PV manufacturing chain
Inline Process Monitoring
Detect defects on the cell surface after every production stage with utmost precision.
Inline Quality Sorting
Ensure quality standards by classifying finished solar cells according to their optical properties.
Connected PV 4.0
Cloud-based tools for significantly enhanced productivity and 100% production transparency in photovoltaic manufacturing.
Do you need further information? – We will be happy to respond to your request.
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