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100% defect detection: Multiview functions ensure full-coverage inspections for flexible packaging solutions

Reliably detect invisible production errors such as hazing, coating, and cold seal defects.

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Central Recipe Tool with modification log, version control, recipe comparison and automatic recipe roll-out enables intelligent multi-line management

Ramp-up in record time: Simplify your photovoltaic wafer inspection with the Central Recipe Tool

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VISION CHINA
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CIBF China
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