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RE+: 11-14 September, Las Vegas, booth 26091, International Pavilions (Germany)
PV CellTech Conference USA: 3-4 October, San Francisco Airport, The Hyatt Regency
Whether you need strategic advice, or technical expertise, we've got you covered. Don't miss out on this opportunity and unlock the full potential of your cell efficiency and production yield.
The ideal system for every process step – Solar wafer and cell inspection solutions from ISRA VISION / GP Solar
The demand for ever more powerful cells is growing at an almost unstoppable rate. At the same time, manufacturers need the best quality with maximum throughput to be able to produce economically.
With our unique inspection portfolio, we ensure meeting all quality requirements while envisioning full production transparency not only at the system or line level, but also across entire sites. You benefit from maximum efficiency, flexibility, and cost-effectiveness.
Our wafer and cell solutions are powered by our brand:
Detect edge distortions and geometric irregularities in less than one second cycle times. Our inspection systems sort the inspected wafers into different quality classes based on their geometric properties. Wafers that do not meet the desired quality can thus be removed before further processing – ensuring high quality for excellent module effectiveness and permanently reduced warranty costs.
The "Copy-Exact" calibration concept lets users quickly transfer inspection recipes and settings between production lines. This ensures a uniform inspection standard and reduces the system set-up workload.
Features
Incoming quality control of full square wafers or half-cut samples
Check for any breakage or damage to the outer contour
Use of matrix cameras to ensure perfect reliability of measured dimensional accuracy
Efficient: Evaluate two or more half cells with only one image acquisition
Precise metrological calibration traceable to national standards
Seamless integration into Connected PV for central recipe management and factory defect yield and effect overview
Typical defects
Dimensional defects: non-rectangularity (angles <>90°), size mismatch (edge lengths <> specified value), chamfer length deviations
Contour defects: intrusions, V-breaks, breakage, chippings
Technical data
Solutions for on-the-fly measurement and stop-and-go automation
On the fly, checks only geometry and contour
Stop & Go, combined with surface inspection
On the fly, edge chippings, combined with micro-crack
Microcracks in wafers or cells can cause breakage during downstream processes or in the finished module. This can result in reduced production throughput or degraded performance in the field. Non-contact crack detection technology identifies affected wafers and cells without mechanically stressing the material. Immediate ejection lowers processing costs and boosts resource-efficient production.
Features
Unique illumination technology to make the smallest microcracks visible
Very sensitive to small edge chippings as they occur due to combined laser/mechanical separation of half- and triple-cut wafers
Typical defects
Microcracks
Contour Defects: intrusions, V-breaks, breakage, chippings
Technical data
Innovative inspection technology reliably and repeatedly detects visual defects such as stains, fingerprints, or chips on the surface of as-cut wafers. With its multi-image capture technology, the system can reliably detect even low-contrast defects, enabling 100% monitoring of wafer production. It classifies the wafers into different quality classes based on the data collected.
Line-scan camera technology allows on-the-fly inspection with a moving sample, enabling the highest throughput.
Features
Incoming quality control of full square wafers or half-/triple-cut samples
Inspection of the wafer surface for even low-contrast visual defects and visible contamination and damage
Reporting of the count, size, and position for each defect type
Typical defects
Technical data
WAF-Q: Stop & Go, surface inspection combined with contour check and precise dimensional check
WAF-Q SCAN: on-the-fly, surface and contour inspection only
Texture strongly influences the color appearance and the efficiency of the finished cell. Defective and insufficiently textured wafers that are overlooked here take up valuable machine resources in the subsequent process steps.
The TEX-Q inspection system precisely monitors the cell surface for contamination and defects while checking the texturing for homogeneity and reflectivity. The cameras can also be fitted beneath the roller transport.
Features
Texturing quality monitoring: Inspection of homogeneity and reflectivity
Check for contaminations and defects, long-term drifts
Connected PV "boat view": trace back faulty cells to carrier, machine, and chemical bath
Cycle times <0.7 sec for the highest throughputs
Line scan technology for the highest sensitivity
Typical defects
Flow marks ("comets")
Dark spots
Flow patterns
Contaminations
Texture inhomogeneity
Technical data
Line scan camera technology for easy integration into on-the-fly processes
Suitable for every texture: alkaline, acidic, MCCE (black silicon)
Inspection of wafer sizes from M6 to M12+
Homogeneous color and coating are a prerequisite for homogeneous modules.
Color and defect inspection with COL-Q immediately after the coating process ensures fast intervention in the case of color deviations. CELL-Q checks the color and coating quality during the final inspection and sorts the cells into different performance classes based on their optical properties.
Features
Inspection of color (HSV color model based on RGB color measurement)
Inspection of coating thickness (use a physical model to calculate a layer thickness)
PRO Matrix systems: full camera resolution at 2 Bit color depth - no interpolation
Detection of inhomogeneous samples
Inspection of the bottom side with the line-scan system without flipping
ConnectedPV "Boat View": trace back defective samples to the individual boat/furnace/tube/position in the process
Typical defects
Coating defects, inhomogeneities, wrong coating thickness
Technical data
On-the-fly inspection with up to 1,500 mm/s (resolution 2k), up to 2,000 mm/s (1k)
Unrivaled color repeatability of < 0.5 deg (H), <0.5 % (S,V)
Printing solar cells is one of the most expensive process steps in the cell production chain. Therefore, detecting process deviations at an early stage is crucial.
Discover the market-leading print pattern monitoring and inspect reliably at the highest line speeds. Identify and classify low-micron discontinuities and deliver cells of the highest quality.
Features
Inspection of each printing step directly on a rotary table or immediately following the print table unloading
Inspection of the print pattern features based on a CAD-like model of the print pattern
Detection and quantification of deviations from the expected print pattern design
Higher accuracy than pattern matching from a teched pattern
Print alignment control - check that the print is correctly aligned with other structures on the cell (laser contact openings, selective emitter structures, and others)
Fast breakage signal in case of wafer breakage to avoid consequential misprinting
Feedback of print position, busbar position, and other information to automation for use as feedback loop input for automatic print adjustment or positioning of IV tester contact bars in final sorting
Typical defects
Finger interrupts, thinnings, slubs, nodes, paste stains, and smearings, missing paste on busbar
Measurement of local finger-width, incl. probe regions, for comparison with offline data
Measurement of print position and misalignment with other structures
Special set of defects for IBC cell print patterns (bridging and others)
Technical data
< 0.7 sec cycle time for a single image (print and fiducials only) in PRINT-Q
< 0.6 sec cycle time for a single image (print and fiducials) in PRINT-Q SCAN
Flawless plating improves conductivity and increases the efficiency of the solar cell. Careful quality control and monitoring are essential to ensure solar cells are uniformly plated. Manufacturers must quickly identify inhomogeneities, surface adhesion problems, and contaminations before affecting quality. This ensures high durability and prevents efficiency loss.
Features
After plating inspection of the contact pattern features, based on a CAD-like model of the pattern
Higher accuracy than pattern matching from a teched pattern
Detection of typical plating defects like ghost-plating and detached fingers
Measurement of contact grid position
Detection and quantification of deviations from the expected pattern design
Contact grid quality inspection with all of the above also in the final sorting
Typical defects
Finger interrupts, thinnings, slubs, nodes, stains, ghost plating, missing plating
Measurement of local finger-width, incl. probe regions, for comparison with offline data
Measurement of print position and misalignment with other structures
Technical data
< 0.7 sec cycle time for a single image (grid and fiducials only) in PRINT-Q
< 0.6 sec cycle time for a single image (grid and fiducials) in PRINT-Q SCAN
For high-performance cells such as IBCs (Interdigitated Back Contact), the perfect alignment of the individual layers is a prerequisite for realizing the full cell performance potential.
Even the slightest shift in the pattern or structure will result in a loss of cell efficiency.
Our inspection solutions for patterns and structures not only detect optical defects such as finger breaks but also check the correct alignment and position of the different layers in relation to each other.
Features
Controlling the pattern accuracy of structured layers directly after structuring: detect deviations from the desired form and the desired position of the pattern
Inspection of pattern features based on a CAD-like model of the pattern, or special "no teaching" algorithms
Inspect patterned layers, e.g., for IBC cell fabrication: printed, plasma or chemically deposited, laser structured, shadow mask evaporated, or any other type of patterned layer
Obtain information on the color, thickness, and optical quality of the layer
Typical defects
Interrupts, thinnings, nodes, slubs, bridgings, holes, misalignment of the pattern
Thickness deviation, color deviation of the layer
Positioning of the pattern on the wafer relative to underlying structures
Technical data
On-the-fly or stop-and-go measurement is possible, depending on layer, pattern, and application
Solutions:
PRINT-Q SE for simple pattern inspection
PRINT-Q SCAN for simple pattern inspection on-the-fly
PRINT-Q SBD for pattern, layer, and full-area alignment control
CELL-Q for final sorting
Cell sorting at the end of the line is mandatory for high-value modules of homogenous color.
The CELL-Q inline inspection system checks the front or back of solar cells and sorts them into different color and quality classes according to their optical properties. In a single inspection step, CELL-Q checks every solar cell's print quality and anti-reflection coating.
Any print and color defects on all cell technologies are reliably detected. Additionally, CELL-Q identifies visible surface and contour defects to ensure that only homogeneous cells regarding color and performance are processed within one module.
Features
Sorting of cells in color classes
Sorting of cells according to the optical quality of the contact grid
Separate result classes for color class and optical quality
Multi-view technology with up to 4 images for the highest detection rates and lowest overkill
Handover of busbar positions for pre-positioning of the IV contact bars
Typical defects
Color defects: discolorations, inhomogeneities
Surface defects: stains, fingerprints, scratches
Grid defects: interruptions, thinnings, slubs, nodes, stains, smearings, mispositioning
Technical data
Even for wafer sizes over 210 mm
Recipe Copy-Exact
LightDome Technology for the highest isotropy and homogeneity
Multi-view Technology for the highest sensitivity in surface defect detection
Image analysis on Cumulative Defect Overlay Image
To be an industry leader in the production of photovoltaic cells, companies must offer more than impeccable product quality: Perfectly coordinated processes across systems, production lines, and factories are the basis for maximum profitability, reliability, and short downtimes.
To achieve this, we have developed Connected Photovoltaics 4.0. This cloud-based software solution connects inspection systems, enabling consistent quality settings across all production facilities. It creates transparency, improves process control, and increases the profitability of PV production sites.
With its software features, Connected PV 4.0 meets the key challenges of PV manufacturing.
Central Recipe Tool
The Central Recipe Tool (CRT) allows recipe changes, including version control and approvals, to be made centrally. Identical settings are rolled out to all lines at the click of a mouse. CRT makes plants with identical quality settings comparable.
EPROMI live
The software tool EPROMI live – Enterprise Production Management Intelligence is the latest feature of Connected PV.
EPROMI live makes data analysis much more intuitive, and flexibly adaptable to your needs. With EPROMI live, you browse your production data the way you want and wherever you want: in maximum depth of detail and comprehensive data differentiation or briefly summarized, always independent of device and location. Individually configured dashboards provide the desired information at a glance and ensure 100% production and quality transparency for PV manufacturers.
Company-wide connection of all inspection systems to:
Collect continuous data for real-time process analysis
Visualize and analyze live consistent production data from all systems
Compare machine and production performance based on identical quality settings
For the efficient and future-proof operation of your production systems our highly qualified service teams support you globally in all matters. We provide the implementation, maintenance and servicing as well as the analysis and optimization of your systems - quickly, reliably, 24/7.
Visit our service center and request your customized service solution.
Furthermore, learn in the ISRA VISION Academy how our competent trainers always keep your employees up to date with the latest knowledge so that system operators, product engineers and quality managers become real inspection experts.
Visit our ISRA VISION Academy and book your individual and scalable trainings.
Business Unit Sales Manager
Richard-Willstätter-Straße 14
12489
, Berlin
germany