SOLAR CELL & MODULE INLINE INSPECTION AND DATA ANALYTICS

Print inspection of a solar cell, combined with the idea of data analytics

Best data quality for solar manufacturing excellence

In solar cell and module manufacturing, performance depends on the quality of your data. Hidden defects, limited visibility, and slow ramp-up processes restrict efficiency across modern production lines.

TopCon solar cell quality inspection of print process

Our inspection and data analytics solutions deliver superior data quality across all solar cell technologies - enabling transparent processes and precise control where it matters most.

This foundation of reliable, high-resolution data empowers manufacturers to achieve measurable efficiency gains, resulting in higher yield stability and lower cost per watt.

What sets a vision expert apart in solar manufacturing

Maximum data depth

High‑quality inspection data — ensuring transparency, confident decisions, and insights that standard systems miss.

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Unlocked agility

AOI performance beyond fixed KPIs - unlocking hidden process potential and full inspection flexibility.
 

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Proven expertise

Dedicated vision specialists delivering reliable AOI for TopCon, HJT, xBC and Perovskite.

 

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Close collaboration

Quick response times and expert on‑site support for smooth operations and fast issue resolution.
 

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Benefits

  • Lower cost per watt: Optimize processes, save resources and reduce scrap or downstream failures
  • Maximized efficiency: Increase yield stability, equipment efficiency and cell performance across all production stages
  • Faster ramp-up: Benefit from centralized recipe management and smart software solutions to gain actionable insights and to speed production startup.
  • Data-driven decisions : Leverage comprehensive and flexible data for continuous process improvement.

Solutions for cell manufacturing

Our inspection and data analytics solutions for TopCon cell production provide detailed visibility into critical process steps across the entire cell architecture.

High-resolution inspection data enables layer-specific analysis of passivation quality, tunnel oxide integrity, contact formation, and defect distribution. Manufacturers can detect process deviations at an early stage and precisely localize their root causes within the cell structure.

This level of process transparency supports stable production conditions and consistent yield performance in high-volume TopCon manufacturing.

Incoming wafer inspection

Geometry and contour, edge distortions, chamfer deviations, micro-cracks, surface defects (stains, dust particles, scratches, watermarks)

Incoming

Poly-deposition​, AlOx & SiNx coating​

Coating defects (flakes, discolorations), color, layer thickness, layer homogeneity, coating overlap to rear side 
 

Deposition

Printing

Finger & busbar width, micro-interruptions, thinnings, position and rotation, pattern alignment, FS-RS busbar position alignment
 

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Sorting

Color and performance binning





 

Cell sorting

Our inspection and data analytics solutions for Heterojunction (HJT) cell production deliver precise insights across all key process steps, including:​

  • Incoming wafer inspection
    Geometry and contour, edge distortions, chamfer deviations, micro-cracks, surface defects (stains, dust particles, scratches, watermarks)​

  • Layer deposition (i-a-Si, n/p-a-Si, μc-Si)​, TCO coating​
    Coating defects (flakes, discolorations), color, layer thickness, layer homogeneity, coating overlap to rear side 

  • Printing​
    Subpixel‑accurate inspection of fingers, busbars, paste defects, print‑to‑substrate/laser pattern alignment, and multi‑busbar positioning

  • Sorting​
    Reproducible performance binning based on color and optical quality

​By analyzing rich, high-resolution data at every step, manufacturers can detect deviations early, optimize layer uniformity, and reduce cost per watt. The result: higher cell efficiency, faster ramp-up, and full transparency across the HJT process chain.​

Precision in alignment and masking control​
We support back contact architectures with specialized analytics for masking layer inspection and alignment control. This ensures accurate contact placement, reduced defects, and optimized electrical performance - critical for high-efficiency designs.​

  • Masking layer inspection​

  • Alignment control​

Insight into complex multi-layer architectures​
Our analytics cover both bottom and top cell processes in Perovskite (tandem) architectures. From TCO layers to ETL, absorber, and HTL deposition, we provide actionable insights that help stabilize performance, improve layer quality, and accelerate innovation in next-gen solar cells.​

  • Bottom Cell: Incoming, deposition, coating (AIOx / SiNx), printing, sorting​

  • Top Cell: TCO layers, ETL/absorber/HTL, printing, sorting

Solutions for module assembly

Ensure stable string quality before lamination​

Our photoluminescence-based string inspection identifies critical issues before lamination, helping manufacturers avoid costly rework and improve module yield.​

  • Detect inactive or underperforming cells within the string​
  • Check ribbon and solder connections for correct placement and integrity​
  • Identify misalignment or defects affecting current flow

This enables precise identification of electrical and mechanical defects at string level, ensuring consistent string quality and preventing defect propagation into subsequent module assembly steps.

As part of incoming quality control, we inspect cells before stringing, checking for defects and sorting them into color and performance classes. This ensures only high‑quality cells enter module assembly.

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Sorting parameters

  • Print geometry and quality: Position and rotation of print patterns, edge distance, finger and busbar width, finger/busbar defects, print defects, alignment control of laser/print pattern
  • Coating quality: Coating defects, color impression, optical layer thickness
  • Surface quality: Low-contrast defects such as stains, fingerprints, scratches
  • Cell geometry and contour: Edge and corner dimensions, chamfer lengths/angles, diagonals, contour defects (breaks, V‑breaks)

Connected PV: Data Analytics and system management

Connected PV integrates inspection data, process information, and system management into a unified platform, bridging operations and analytics across the entire production line.

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On the operations side, it enables centralized control of users, software, and inspection recipes, including pre‑qualification and consistent deployment across systems. This ensures stable and standardized production conditions across lines and factories.

On the analytics side, Connected PV provides detailed evaluation of inspection results at defect level, as well as yield and system health monitoring across all process steps. Relationships between process parameters, defects, and production conditions can be analyzed and traced across the entire line.

By combining operational control with flexible data analysis, Connected PV enables a deeper understanding of manufacturing processes and supports stable, scalable production performance.

Visit us at Intersolar Europe 2026!

June 23–25, Hall A2, booth 109

Join us at our joint stand together with RENA. Our experts will be available to discuss how targeted inspection data can help improve solar cell efficiency and to answer your questions directly.

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Media hub

Quality inspection and data analysis for solar production [EN]

Advanced quality inspection and data analysis for solar cell and module manufacturers
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mvs-so-br-pv-cell-overview.pdf
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LUMI-Q Coating

LUMI-Q Coating flyer
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LUMI-Q String [EN]

LUMI-Q String flyer
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Higher efficiency in photovoltaic production

Discover how precise calibration of your inspection systems lays the foundation for ensuring identical quality standards across different lines, plants and locations using globally valid settings.

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Precise alignment across the entire solar cell enhances efficiency and performance

Learn in our technical paper how data on production deviations form the basis for optimizing production parameters.

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Contact us and let’s shape the future of solar together

Whether you're a cell manufacturer, a module producer, or exploring newtechnologies from a scientific point of view, whether you are experienced orjust entering the solar industry—we’re here to support you. As your trusted partner in inspection and data analytics, we offer tailored solutions, expert guidance, and personal support to help you reach your goals.

Tom Thieme
Business Unit Sales Manager

Richard-Willstätter-Straße 14
12489 Berlin
Germany

Phone: +49 / 30 / 421 04 -720

E-Mail: tthieme@isravision.com

Contact us