GEO-Q solutions are powered by
Geometry measurement and contour inspection for photovoltaic wafers
Captures one single matrix image on the fly
Support for half-cut samples - two samples in a single camera image
Dimensional check (edge lengths, angles, chamfer lengths, chamfer angles)
Contour defects (Intrusions, V-Breaks, Breakage, chamfer breakage)
Inspection of wafer sizes from M6 to M12+
Edge distortions and geometric irregularities are detected in cycle times of less than one second. The inspected wafers are sorted into different quality classes based on their geometric properties. Wafers that do not meet the desired quality can thus be removed before further processing – ensuring high quality for excellent module effectiveness and permanently reduced warranty costs.
With the “Copy-Exact” calibration concept, users can also transfer inspection recipes and settings quickly between production lines. This ensures a uniform inspection standard and reduces the system set-up workload
Wafer and Cell
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germany
Frankfurter Straße 112, 64293 Darmstadt, Germany +49 (6151) 948-0 [email protected]