FPM-Inspect

High-resolution detection of typical glass and surface defects

Complete product range for surface and edge inspection, plus review station

Extremely short inspection line for thin glass substrates

Improved classification due to defect information from multiple optical channels

Detection of even the tiniest scratches

Precise defect detection for reliable quality classification

The surface inspection system FPM-Inspect checks thin glass substrates using various illumination channels and high-resolution cameras. It guarantees reliable quality classification and ensures that customers receive only flawless material.

The system can combine up to three inspection tasks:

High-resolution detection of typical glass and surface defects: FPM-Inspect reliably detects and classifies even the tiniest defects like cullets, dents, PT needles, inclusions, or bubbles.
Detection of even the tiniest scratches; the illumination system is specifically designed for detection of scratches independent on orientation.
Particle counting: The integrated particle illumination system allows FPM-Inspect to detect all sub-µm particles.

This 3-in-1 solution saves space and operating costs by eliminating the need for additional inspection systems. The additional products FPM-Edge and FPM-Review complete the inspection line with edge inspection and an automatic microscope for defect review.